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Last updated on Thursday, November 16, 2023
@inproceedings{KuhnXP2008,
author = {Adrian Kuhn and Bart Van Rompaey and
Lea H\"ansenberger and Oscar Nierstrasz and
Serge Demeyer and Markus Gaelli and
Koenraad Van Leemput},
booktitle = {Proceedings {XP}'08 (9th International Conference on
Extreme Programming and Agile Processes in Software
Engineering},
editor = {P. Abrahamsson},
month = apr,
note = {Acceptance ratio: 16/54 = 30\%},
publisher = {Springer-Verlag},
title = {JExample: Exploiting Dependencies Between Tests to
Improve Defect Localization},
year = {2008},
abstract = {To quickly localize defects, we want our attention to
be focussed on relevant failing tests. We propose to
improve defect localization by exploiting
dependencies between tests, using a JUnit extension
called JExample. In a case study, a monolithic
white-box test suite for a complex algorithm is
refactored into two traditional JUnit style tests and
to JExample. Of the three refactorings, JExample
reports five times fewer defect locations and
slightly better performance (-8-12\%), while having
similar maintenance characteristics. Compared to the
original implementation, JExample greatly improves
maintainability due the improved factorization
following the accepted test quality guidelines. As
such, JExample combines the benefits of test chains
with test quality aspects of JUnit style testing.},
annote = {internationalconference},
doi = {10.1007/978-3-540-68255-4_8},
isbn = {978-3-540-68254-7},
}